SQJ409EP
www.vishay.com Vishay Siliconix
S16-2658-Rev. A, 02-Jan-17 2Document Number: 77707
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Notes
a. Pulse test; pulse width 300 μs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TC = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-source breakdown voltage VDS VGS = 0, ID = -250 μA -40 - - V
Gate-source threshold voltage VGS(th) VDS = VGS, ID = -250 μA -1.5 -2.0 -2.5
Gate-source leakage IGSS V
DS = 0 V, VGS = ± 20 V - - ± 100 nA
Zero gate voltage drain current IDSS
VGS = 0 V VDS = -40 V - - -1
μA VGS = 0 V VDS = -40 V, TJ = 125 °C - - -50
VGS = 0 V VDS = -40 V, TJ = 175 °C - - -150
On-state drain current a I
D(on) V
GS = -10 V VDS -5 V -30 - - A
Drain-source on-state resistance a R
DS(on)
VGS = -10 V ID = -10 A - 0.0058 0.0070
VGS = -10 V ID = -10 A, TJ = 125 °C - - 0.0106
VGS = -10 V ID = -10 A, TJ = 175 °C - - 0.0126
VGS = -4.5 V ID = -6 A - 0.0083 0.0100
Forward transconductance bgfs VDS = -15 V, ID = -10 A - 54 - S
Dynamic b
Input capacitance Ciss
VGS = 0 V VDS = -25 V, f = 1 MHz
- 8400 11 000
pF Output capacitance Coss - 620 850
Reverse transfer capacitance Crss - 510 700
Total gate charge cQg
VGS = -10 V VDS = -20 V, ID = -5 A
- 170 260
nC Gate-source charge cQgs -24-
Gate-drain charge cQgd -35-
Gate resistance Rgf = 1 MHz 0.50 1.08 1.70
Turn-on delay time ctd(on)
VDD = -20 V, RL = 4
ID -5 A, VGEN = -10 V, Rg = 1
-2335
ns
Rise time ctr -1830
Turn-off delay time ctd(off) -75120
Fall time ctf -1220
Source-Drain Diode Ratings and Characteristics b
Pulsed current aISM ---150A
Forward voltage VSD IF = -10 A, VGS = 0 V - -0.76 -1.2 V
Body diode reverse recovery time trr
IF = -10 A, dI/dt = 100 A/μs
-3990ns
Body diode reverse recovery charge Qrr -45100nC
Reverse recovery fall time ta-22-
ns
Reverse recovery rise time tb-19-
Body diode peak reverse recovery
current IRM(REC) --2.3- A