To our custo mers,
Old Company Name in Catalogs and Other Documents
On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology
Corporation, and Renesas Electronics Corpor ation took over all the business of both
companies. Therefore, althoug h the old com pany name remains in this docum ent, it is a valid
Renesas Electronics document. W e appreciate your understanding.
Renesas Electronics website: http://www.renesas.com
April 1st, 2010
Renesas Electronics Corporation
Issued by: Renesas Electronics Corporation (http://www.renesas.com)
Send any inquiries to http://www.renesas.com/inquiry.
Notice
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REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 1 of 11
Preliminary
HAT3008R, HAT3008RJ
Silicon N / P Channel Power MOS FET
High Speed Power Switching
REJ03G1198-0500
Rev.5.00
Aug 25, 2009
Features
For Automotive Application (at Type Code “J”)
Low on-resistance
Capable of 4 V gate drive
High density mounting
Outline
RENESAS Package code: PRSP0008DD-D
(Package name: SOP-8 <FP-8DAV> )
1, 3 Source
2, 4 Gate
5, 6, 7, 8 Drain
G
D
S
D
G
D
S
D
Nch Pch
1
2
78
4
56
3
1234
5
6
7
8
Absolute Maximum Ratings
(Ta = 25°C)
Value
Item Symbol
Nch Pch Unit
Drain to source voltage VDSS 60 –60 V
Gate to source voltage VGSS ±20 ±20 V
Drain current ID 5 –3.5 A
Drain peak current ID (pulse) Note 1 40 –28 A
Body-drain diode reverse drain current IDR 5 –3.5 A
HAT3008R — Avalanche current
HAT3008RJ
IAP Note 4
5 –3.5 A
HAT3008R — Avalanche energy
HAT3008RJ
EAR Note 4
2.14 1.05 mJ
Channel dissipation Pch Note 2 2 2 W
Channel dissipation Pch Note 3 3 3 W
Channel temperature Tch 150 150 °C
Storage temperature Tstg –55 to +150 –55 to +150 °C
Notes: 1. PW 10 μs, duty cycle 1%
2. 1 Drive operation: When using the glass epoxy board (FR4 40 × 40 × 1.6 mm), PW 10 s
3. 2 Drive operation: When using the glass epoxy board (FR4 40 × 40 × 1.6 mm), PW 10 s
4. Value at Tch = 25°C, Rg 50 Ω
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 2 of 11
Electrical Characteristics
N Channel
(Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V (BR) DSS 60 V ID = 10 mA, VGS = 0
Gate to source breakdown voltage V (BR) GSS ±20 — V IG = ±100 μA, VDS = 0
Gate to source leak current IGSS±10 μA VGS = ±16 V, VDS = 0
HAT3008R IDSS1 μA
Zero gate voltage drain
current HAT3008RJ IDSS0.1 μA
VDS = 60 V, VGS = 0
HAT3008R IDSSμA
Zero gate voltage drain
current HAT3008RJ IDSS10 μA
VDS = 48 V, VGS = 0
Ta = 125°C
Gate to source cutoff voltage VGS (off) 1.2 2.2 V VDS = 10 V, ID = 1 mA
RDS (on)0.043 0.058 Ω I
D = 3 A, VGS = 10 V Note 5 Static drain to source on state resistance
RDS (on)0.056 0.084 Ω I
D = 3 A, VGS = 4 V Note 5
Forward transfer admittance |yfs| 6 9 S ID = 3 A, VDS = 10 V Note 5
Input capacitance Ciss — 520 — pF
Output capacitance Coss — 270 — pF
Reverse transfer capacitance Crss 100 pF
VDS = 10 V
VGS = 0
f = 1 MHz
Turn-on delay time td (on)11 ns
Rise time tr40 ns
Turn-off delay time td (off) — 110 — ns
Fall time tf80 ns
VGS = 10 V, ID = 3 A
VDD 30 V
Body-drain diode forward voltage VDF0.84 1.1 V IF = 5 A, VGS = 0 Note 5
Body-drain diode reverse recovery time trr40 ns IF = 5 A, VGS = 0
diF/dt = 50 A/μs
Note: 5. Pulse test
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 3 of 11
P Channel
(Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V (BR) DSS –60 V ID = –10 mA, VGS = 0
Gate to source breakdown voltage V (BR) GSS ±20 — V IG = ±100 μA, VDS = 0
Gate to source leak current IGSS±10 μA VGS = ±16 V, VDS = 0
HAT3008R IDSS–1 μA
Zero gate voltage drain
current HAT3008RJ IDSS–0.1 μA
VDS = –60 V, VGS = 0
HAT3008R IDSSμA
Zero gate voltage drain
current HAT3008RJ IDSS–10 μA
VDS = –48 V, VGS = 0
Ta = 125°C
Gate to source cutoff voltage VGS (off) –1.2 — –2.2 V VDS = –10 V, ID = –1 mA
RDS (on)0.12 0.15 Ω I
D = –2 A, VGS = –10 V Note 6 Static drain to source on state resistance
RDS (on)0.16 0.23 Ω I
D = –2 A, VGS = –4 V Note 6
Forward transfer admittance |yfs| 3 4.5 S ID = –2 A, VDS = –10 V Note 6
Input capacitance Ciss — 600 — pF
Output capacitance Coss — 290 — pF
Reverse transfer capacitance Crss 75 pF
VDS = –10 V
VGS = 0
f = 1 MHz
Turn-on delay time td (on)11 ns
Rise time tr30 ns
Turn-off delay time td (off) — 100 — ns
Fall time tf55 ns
VGS = –10 V, ID = –2 A
VDD –30 V
Body-drain diode forward voltage VDF–0.98 –1.28 V IF = –3.5 A, VGS = 0 Note 6
Body-drain diode reverse recovery time trr70 ns IF = –3.5 A, VGS = 0
diF/dt = 50 A/μs
Note: 6. Pulse test
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 4 of 11
Main Characteristics
N Channel
Channel Dissipation Pch (W)
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Drain to Source Voltage VDS (V)
Drain Current ID (A)
Maximum Safe Operation Area
Drain to Source Voltage VDS (V)
Drain Current ID (A)
Typical Output Characteristics
Gate to Source Voltage VGS (V)
Drain Current ID (A)
Typical Transfer Characteristics
Note 7:
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm)
4.0
0
1.0
2.0
3.0
0 50 100 150 200
100
30
10
3
1
0.3
0.1
0.03
0.01
0.1 0.3 1 3 10 30 100
10
0
2
4
6
8
0246 810
2.5 V
3 V
3.5 V
V
GS
= 2 V
10
0
2
4
6
8
012345
Operation in
this area is
limited by R
DS (on)
Pulse Test V
DS
= 10 V
Pulse Test
Test Condition:
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm), PW 10 s
Gate to Source Voltage VGS (V)
Drain to Source Voltage VDS (on) (V)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Drain Current ID (A)
Drain to Source on State Resistance
RDS (on) (Ω)
Static Drain to Source on State Resistance
vs. Drain Current
0.5
0
0.1
0.2
0.3
0.4
048121620
2 A
1 A
I
D
= 5 A
0.1 0.3 1 3 10 30 100
1.0
0.5
0.2
0.05
0.1
0.02
0.01
Pulse Test
–25°C
Tc = 75°C
2 Drive Operation
1 Drive Operation
10 V
10 V
V
GS
= 4 V
Pulse Test
Ta = 25°C
1 shot Pulse
PW = 10 ms (1 shot)
1 ms
100 μs
DC Operation (PW 10 s)
Note 7
10 μs
4 V
25°C
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 5 of 11
Case Temperature Tc (°C)
Static Drain to Source on State Resistance
RDS (on) (Ω)
Static Drain to Source on State Resistance
vs. Temperature
Forward Transfer Admittance |yfs| (S)
Drain Current ID (A)
Forward Transfer Admittance vs.
Drain Current
0.20
0.16
0.04
0.08
0.12
–40 0 40 80 120 160
0
ID = 5 A
1 A, 2 A, 5 A
10 V
VGS = 4 V
0.1 0.2 0.5 1 2 5 10
50
20
5
10
2
0.5
1
Pulse Test
Reverse Drain Current IDR (A)
Reverse Recovery Time trr (ns)
Body-Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage VDS (V)
Typical Capacitance vs.
Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage VDS (V)
Gate to Source Voltage VGS (V)
Dynamic Input Characteristics
0.1 0.2 0.5 1 2 5 10
500
200
100
20
50
10
5
01020304050
2000
1000
500
200
100
50
20
10
100
0
20
40
60
80
0
20
816243240
0
4
8
12
16
VGS
VDS
ID = 5 A
VDD = 10 V
25 V
50 V
VDD = 50 V
25 V
10 V
di / dt = 50 A / μs
VGS = 0, Ta = 25°C
1 A, 2 A
Drain Current ID (A)
Switching Time t (ns)
Switching Characteristics
100
300
10
3
0.1 0.2 1 1020.5
1000
30
5
1
25°C
Tc = –25°C
75°C
VDS = 10 V
Pulse Test
Ciss
Coss
Crss
VGS = 0
f = 1 MHz
tr
td(on)
td(off)
tf
VGS = 10 V, VDD = 30 V
PW = 5 μs, duty 1 %
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 6 of 11
Source to Drain Voltage V
SD
(V)
Reverse Drain Current I
DR
(A)
Reverse Drain Current vs.
Source to Drain Voltage
2.5
25 50 75 100 125 150
0
0.5
1.0
1.5
2.0
Channel Temperature Tch (°C)
Repetitive Avalanche Energy E
AR
(mJ)
Maximum Avalanche Energy vs.
Channel Temperature Derating
I
AP
= 5 A
V
DD
= 25 V
L = 100 μH
duty < 0.1 %
Rg 50 Ω
10
0
2
4
6
8
0 0.4 0.8 1.2 1.6 2.0
Pulse Test
5 V
V
GS
= 0, –5 V
10 V
Avalanche Test Circuit Avalanche Waveform
0
I
D
V
DS
I
AP
V
(BR)DSS
V
DD
E
AR
= • L • I
AP2
2
1V
DSS
V
DSS
– V
DD
D.U.T
Rg
IAP
Monitor
VDS
Monitor
VDD
50 Ω
Vin
15 V
L
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
90%
10%
tf
Switching Time Test Circuit Switching Time Waveform
Vin Monitor
D.U.T.
Vin
10 V 50 Ω
R
L
Vout
Monitor
V
DD
= 30 V
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 7 of 11
P Channel
4.0
1.0
0
2.0
3.0
0
Channel Dissipation Pch (W)
50 100 150 200
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Test Condition:
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm), PW 10 s
Drain to Source Voltage V
DS
(V)
Drain Current I
D
(A)
Maximum Safe Operation Area
–0.1
–100
–10
–1
–0.1
–0.01
–0.3 –1 –3 –10 –30 –100
–30
–3
–0.3
–0.03
Operation in
this area is
limited by R
DS (on)
Ta = 25°C
1 shot pulse
–10
–8
–6
0
–2
–4
0
Drain to Source Voltage V
DS
(V)
Drain Current I
D
(A)
Typical Output Characteristics
–3 V
Pulse Test
–3.5 V
–2 –4 –6 –8 –10
–10
0
–2
–4
–6
–8
0
Gate to Source Voltage V
GS
(V)
Drain Current I
D
(A)
Typical Transfer Characteristics
–1 –2 –3 –4 –5
Tc = 75°C
–25°C
25°C
V
DS
= 10 V
Pulse Test
Note 8:
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm)
–0.5
0
–0.1
–0.2
–0.3
–0.4
0
Gate to Source Voltage V
GS
(V)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Drain to Source Saturation Voltage
V
DS (on)
(V)
–4 –8 –12 –16 –20
Pulse Test
I
D
= –2 A
–1 A
–0.5 A
Drain Current I
D
(A)
Drain to Source on State Resistance
R
DS (on)
(Ω)
Static Drain to Source on State Resistance
vs. Drain Current
1
0.2
0.5
0.1
0.02
0.05
0.01 –100–0.1 –0.3 –1 –3 –10 –30
100 μs
Note 8
1 ms
PW = 10 ms
DC Operation (PW 10 s)
V
GS
= –2.5 V
–10 V
–5 V
10 μs
2 Drive Operation
1 Drive Operation
–10 V
V
GS
= –4 V
Pulse Test
–4 V
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 8 of 11
0.5
–40 0 40 80 120 160
Case Temperature Tc (°C)
0
0.1
0.2
0.3
0.4
Static Drain to Source on State Resistance
R
DS (on)
(Ω)
Static Drain to Source on State Resistance
vs. Temperature
Pulse Test
–10 V
–1 A
–0.5 A
V
GS
= –4 V
–2 A
Forward Transfer Admittance |yfs| (S)
Forward Transfer Admittance vs.
Drain Current
Drain Current I
D
(A)
20
10
2
5
1
0.2
0.5
–0.1 –0.2 –0.5 –1 –2 –5 –10
Reverse Drain Current I
DR
(A)
Reverse Recovery Time trr (ns)
Body-Drain Diode Reverse
Recovery Time
–0.1 –0.2 –0.5 –1 –2 –5 –10
500
200
100
20
50
10
5
0 –10 –20 –30 –40 –50
Capacitance C (pF)
Drain to Source Voltage V
DS
(V)
Typical Capacitance vs.
Drain to Source Voltage
2000
1000
500
200
100
20
50
10
0
0
Gate Charge Qg (nc)
Drain to Source Voltage V
DS
(V)
0
–20
–16
–12
–8
–4
–100
–80
–60
–40
–20
Gate to Source Voltage V
GS
(V)
Dynamic Input Characteristics
816243240
V
DS
V
GS
I
D
= –3.5 A
V
DD
= –10 V
–25 V
–50 V
V
DD
= –50 V
–25 V
–10 V
Tc = –25°C
75°C
25°C
V
DS
= 10 V
Pulse Test
di / dt = 50 A / μs
V
GS
= 0, Ta = 25°C
–0.5 A, –1 A
I
D
= –2 A
Ciss
Coss
Crss
1000
300
100
10
30
3
1–0.2 –0.5 –1 –2 –5 –10
–0.1
Drain Current I
D
(A)
Switching Time t (ns)
Switching Characteristics
tf
trtd(on)
td(off)
V
GS
= 0
f = 1 MHz
V
GS
= –10 V, V
DD
= –30 V
PW = 5 μs, duty 1 %
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 9 of 11
Source to Drain Voltage V
SD
(V)
Reverse Drain Current I
DR
(A)
Reverse Drain Current vs.
Source to Drain Voltage
2.5
25 50 75 100 125 150
0
0.5
1.0
1.5
2.0
Channel Temperature Tch (°C)
Repetitive Avalanche Energy E
AR
(mJ)
Maximum Avalanche Energy vs.
Channel Temperature Derating
IAP = –3.5 A
VDD = –25 V
L = 100 μH
duty < 0.1 %
Rg 50 Ω
–10
0
–2
–4
–6
–8
0 –0.4 –0.8 –1.2 –1.6 –2.0
Pulse Test
5 V
VGS = 0, 5 V
10 V
Avalanche Test Circuit Avalanche Waveform
0
ID
VDS
IAP
V(BR)DSS
VDD
E
AR
= • L • I
AP2
2
1V
DSS
V
DSS
– V
DD
D.U.T
Rg
IAP
Monitor
VDS
Monitor
VDD
50 Ω
Vin
15 V
L
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
90%
10%
tf
Switching Time Test Circuit Switching Time Waveform
Vin Monitor
D.U.T.
Vin
–10 V
RL
Vout
Monitor
50 Ω
VDD
= –30 V
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 10 of 11
Common
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
Normalized Transient Thermal Impedance γ s (t)
10 μ100 μ1 m10 m 100 m 1 10 100 1000 10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
P
DM
PW
T
D = PW
T
θchf (t) = γ s (t)θchf
θchf = 125°C/W, Ta = 25°C
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm)
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
Normalized Transient Thermal Impedance γ s (t)
10 μ100 μ1 m10 m 100 m 1 10 100 1000 10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
P
DM
PW
T
D = PW
T
θchf (t) = γ s (t) θchf
θchf = 166°C/W, Ta = 25°C
When using the glass epoxy board
(FR4 40 × 40 × 1.6 mm)
HAT3008R, HAT3008RJ Preliminary
REJ03G1198-0500 Rev.5.00 Aug 25, 2009
Page 11 of 11
Package Dimensions
P-SOP8-3.95 × 4.9-1.27 0.085g
MASS[Typ.]
FP-8DAVPRSP0008DD-D
RENESAS CodeJEITA Package Code Previous Code
A
85
14
F
bp
c
Detail F
Terminal cross section
1.27
1.08
0.40
L
1
0.60
0.25
x
0.460.400.34
0.10
b
p
b
1
c
1
0.250.200.15
MaxNomMin
Dimension in Millimeters
Symbol
Reference
5.3
4.90
D
3.95
E
0.14
A
2
6.206.105.80
0.25
1.75
A
0.75
Z
L
8°
c
1.27
e
0.1
y
H
E
A
1
D
*
1
*
2
E
H
E
*
3
xM
bp
e
Z
(Ni/Pd/Au plating) 2.
1. DIMENSIONS "*1(Nom)" AND "*2"
DO NOT INCLUDE MOLD FLASH.
NOTE)
DIMENSION "*3" DOES NOT
INCLUDE TRIM OFFSET.
Index mark
A
1
L1
L
Detail F
y
Package Name
SOP-8
Ordering Information
Part Name Quantity Shipping Container
HAT3008R-EL-E 2500 pcs Taping
HAT3008RJ-EL-E 2500 pcs Taping
Notes:
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