CD4027BM/CD4027BC Dual J-K Master/Slave Flip-Flop with Set and Reset General Description Features These dual J-K flip-flops are monolithic complementary MOS (CMOS) integrated circuits constructed with N- and Pchannel enhancement mode transistors. Each flip-flop has independent J, K, set, reset, and clock inputs and buffered Q and Q outputs. These flip-flops are edge sensitive to the clock input and change state on the positive-going transition of the clock pulses. Set or reset is independent of the clock and is accomplished by a high level on the respective input. All inputs are protected against damage due to static discharge by diode clamps to VDD and VSS. Y Y Y Y Y Wide supply voltage range High noise immunity Low power TTL compatibility Low power Medium speed operation 3.0V to 15V 0.45 VDD (typ.) Fan out of 2 driving 74L or 1 driving 74LS 50 nW (typ.) 12 MHz (typ.) with 10V supply Schematic and Connection Diagrams TL/F/5958 - 1 Dual-In-Line Package Order Number CD4027B TL/F/5958 - 2 Top View C1995 National Semiconductor Corporation TL/F/5958 RRD-B30M105/Printed in U. S. A. CD4027BM/CD4027BC Dual J-K Master/Slave Flip-Flop with Set and Reset February 1988 Absolute Maximum Ratings Recommended Operating Conditions (Note 2) (Note 1 and 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. DC Supply Voltage (VDD) Input Voltage (VIN) Operating Temperature Range (TA) CD4027BM CD4027BC b 0.5 VDC to a 18 VDC DC Supply Voltage (VDD) b 0.5V to VDD a 0.5 VDC Input Voltage (VIN) b 65 C to a 150 C Storage Temperature Range (TS) Power Dissipation (PD) Dual-In-Line 700 mW Small Outline 500 mW Lead Temperature (TL) (Soldering, 10 seconds) 260 C 3V to 15 VDC 0V to VDD VDC b 55 C to a 125 C b 40 C to a 85 C DC Electrical Characteristics CD4027BM (Note 2) Symbol Parameter b 55 C Conditions Min Max a 25 C Min IDD Quiescent Device Current VDD e 5V, VIN e VDD or VSS VDD e 10V, VIN e VDD or VSS VDD e 15V, VIN e VDD or VSS VOL Low Level Output Voltage lIOl k 1 mA VDD e 5V VDD e 10V VDD e 15V High Level Output Voltage lIOl k 1 mA VDD e 5V VDD e 10V VDD e 15V VIL Low Level Input Voltage VDD e 5V, VO e 0.5V or 4.5V VDD e 10V, VO e 1V or 9V VDD e 15V, VO e 1.5V or 13.5V VIH High Level Input Voltage VDD e 5V, VO e 0.5V or 4.5V VDD e 10V, VO e 1V or 9V VDD e 15V, VO e 1.5V or 13.5V 3.5 7.0 11.0 3.5 7.0 11.0 IOL Low Level Output Current (Note 3) VDD e 5V, VO e 0.4V VDD e 10V, VO e 0.5V VDD e 15V, VO e 1.5V 0.64 1.6 4.2 0.51 1.3 3.4 IOH High Level Output Current (Note 3) VDD e 5V, VO e 4.6V VDD e 10V, VO e 9.5V VDD e 15V, VO e 13.5V b 0.64 b 1.6 b 4.2 b 0.51 b 1.3 b 3.4 IIN Input Current VDD e 15V, VIN e 0V VDD e 15V, VIN e 15V VOH Typ 1 2 4 0.05 0.05 0.05 4.95 9.95 14.95 0 0 0 4.95 9.95 14.95 0.1 Max Min Units Max 1 2 4 30 60 120 mA mA mA 0.05 0.05 0.05 0.05 0.05 0.05 V V V 5 10 15 1.5 3.0 4.0 b 0.1 a 125 C 4.95 9.95 14.95 1.5 3.0 4.0 V V V 1.5 3.0 4.0 V V V 3.5 7.0 11.0 V V V 0.88 2.25 8.8 0.36 0.9 2.4 mA mA mA b 0.88 b 2.25 b 8.8 b 0.36 b 0.9 b 2.4 mA mA mA b 10 b 5 b 0.1 10b5 0.1 b 1.0 1.0 mA mA Note 1: ``Absolute Maximum Ratings'' are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of ``Recommended Operating Conditions'' and ``Electrical Characteristics'' provides conditions for actual device operation. Note 2: VSS e 0V unless otherwise specified. Note 3: IOH and IOL are tested one output at a time. 2 DC Electrical Characteristics CD4027BC (Note 2) Symbol Parameter b 40 C Conditions Min Max a 25 C Min IDD Quiescent Device Current VDD e 5V, VIN e VDD or VSS VDD e 10V, VIN e VDD or VSS VDD e 15V, VIN e VDD or VSS VOL Low Level Output Voltage lIOl k 1 mA VDD e 5V VDD e 10V VDD e 15V High Level Output Voltage lIOl k 1 mA VDD e 5V VDD e 10V VDD e 15V VIL Low Level Input Voltage VDD e 5V, VO e 0.5V or 4.5V VDD e 10V, VO e 1V or 9V VDD e 15V, VO e 1.5V or 13.5V VIH High Level Input Voltage VDD e 5V, VO e 0.5V or 4.5V VDD e 10V, VO e 1V or 9V VDD e 15V, VO e 1.5V or 13.5V 3.5 7.0 11.0 3.5 7.0 11.0 IOL Low Level Output Current (Note 3) VDD e 5V, VO e 0.4V VDD e 10V, VO e 0.5V VDD e 15V, VO e 1.5V 0.52 1.3 3.6 0.44 1.1 3.0 IOH High Level Output Current (Note 3) VDD e 5V, VO e 4.6V VDD e 10V, VO e 9.5V VDD e 15V, VO e 13.5V b 0.52 b 1.3 b 3.6 b 0.44 b 1.1 b 3.0 IIN Input Current VDD e 15V, VIN e 0V VDD e 15V, VIN e 15V VOH Typ 4 8 16 0.05 0.05 0.05 4.95 9.95 14.95 0 0 0 4.95 9.95 14.95 0.3 Max Min Units Max 4 8 16 30 60 120 mA mA mA 0.05 0.05 0.05 0.05 0.05 0.05 V V V 5 10 15 1.5 3.0 4.0 b 0.3 a 85 C 4.95 9.95 14.95 1.5 3.0 4.0 V V V 1.5 3.0 4.0 V V V 3.5 7.0 11.0 V V V 0.88 2.25 8.8 0.36 0.9 2.4 mA mA mA b 0.88 b 2.25 b 8.8 b 0.36 b 0.9 b 2.4 mA mA mA b 10 b 5 b 0.3 10b5 0.3 b 1.0 1.0 mA mA Note 1: ``Absolute Maximum Ratings'' are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of ``Recommended Operating Conditions'' and ``Electrical Characteristics'' provides conditions for actual device operation. Note 2: VSS e 0V unless otherwise specified. Note 3: IOH and IOL are tested one output at a time. 3 AC Electrical Characteristics* TA e 25 C, CL e 50 pF, trCL e tfCL e 20 ns, unless otherwise specified Typ Max Units tPHL or tPLH Symbol Propagation Delay Time from Clock to Q or Q Parameter VDD e 5V VDD e 10V VDD e 15V Conditions Min 200 80 65 400 160 130 ns ns ns tPHL or tPLH Propagation Delay Time from Set to Q or Reset to Q VDD e 5V VDD e 10V VDD e 15V 170 70 55 340 140 110 ns ns ns tPHL or tPLH Propagation Delay Time from Set to Q or Reset to Q VDD e 5V VDD e 10V VDD e 15V 110 50 40 220 100 80 ns ns ns tS Minimum Data Setup Time VDD e 5V VDD e 10V VDD e 15V 135 55 45 270 110 90 ns ns ns tTHL or tTLH Transition Time VDD e 5V VDD e 10V VDD e 15V 100 50 40 200 100 80 ns ns ns fCL Maximum Clock Frequency (Toggle Mode) VDD e 5V VDD e 10V VDD e 15V 2.5 6.2 7.6 trCL or tfCL Maximum Clock Rise and Fall Time VDD e 5V VDD e 10V VDD e 15V 15 10 5 tW Minimum Clock Pulse Width (tWH e tWL) VDD e 5V VDD e 10V VDD e 15V 100 40 32 200 80 65 ns ns ns tWH Minimum Set and Reset Pulse Width VDD e 5V VDD e 10V VDD e 15V 80 30 25 160 60 50 ns ns ns CIN Average Input Capacitance Any Input 5 7.5 pF CPD Power Dissipation Capacity Per Flip-Flop (Note 4) 35 5 12.5 15.5 MHz MHz MHz ms ms ms pF *AC Parameters are guaranteed by DC correlated testing. Note 1: ``Absolute Maximum Ratings'' are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of ``Recommended Operating Conditions'' and ``Electrical Characteristics'' provides conditions for actual device operation. Note 2: VSS e 0V unless otherwise specified. Note 3: IOH and IOL are tested one output at a time. Note 4: CPD determines the no load AC power consumption of any CMOS device. For complete explanation, see 54C/74C Family Characteristics application note, AN-90. 4 Typical Applications Ripple Binary Counters TL/F/5958 - 3 Shift Registers TL/F/5958 - 4 Truth Table X t Outputs n # tnb1 Inputs CL U J K S R Q Q Q L L L L K X X X I X O X X X X X X O X I X X X X O O O O O I O I O O O O O O I I O I O I X X X X I I O O O O I I (No Change) O I I Where: I e High Level O e Low Level U e Level Change X e Don't Care # e tnb1 refers to the time interval prior to the positive clock pulse transition X e tn refers to the time intervals after the positive clock pulse transition 5 I O I CD4027BM/CD4027BC Dual J-K Master/Slave Flip-Flop with Set and Reset Physical Dimensions inches (millimeters) Ceramic Dual-In-Line Package (J) Order Number CD4027BMJ or CD4027BCJ NS Package Number J16A Molded Dual-In-Line Package (N) Order Number CD4027BMN or CD4027BCN NS Package Number N16E LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 1111 West Bardin Road Arlington, TX 76017 Tel: 1(800) 272-9959 Fax: 1(800) 737-7018 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 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