
HI-SINCERITY
MICROELECTRONICS CORP.
Spec. No. : MOS200407
Issued Date : 2004.10.01
Revised Date : 2005. 04.22
Page No. : 2/4
HIRF830, HIRF830F HSMC Product Specification
ELectrical Characteristics (Tj=25°C, unless otherwise specified)
Symbol Characteristic Min. Typ. Max. Unit
V(BR)DSS Drain-S ourc e Br eakdown Vo ltage (VGS=0V, ID=250uA) 500 - - V
Drain-Source Leakage Current (VDS=500V, VGS=0V) - - 1 uA
IDSS Drain-Source Leakage Current (VDS=400V, VGS=0V, Tj=125°C) 50 uA
IGSSF Gate-Source Leakage Current-Forward (Vgsf=20V, VDS=0V) - - 100 nA
IGSSR Gate-Source Leakage Current-Reverse (Vgsr=-20V, VDS=0V) - - -100 nA
VGS(th) Gate Threshold V oltage (VDS=VGS, ID=250uA) 2 - 4 V
RDS(on) Static Drain-Source On-Resistance (VGS=10V, ID=2.7A)(*4) - - 1.5 Ω
gFS Forward Transconductance (VDS=50V, ID=2.7A)(*4) 2.5 - - S
Ciss Input Capacitance - 800 -
Coss Output Capacitance - 100 -
Crss Reverse Transfer Capacitance VDS=25V, VGS=0V, f=1MHz -50-pF
td(on) Turn-on Delay Time - 8.2 -
trRise T i me - 46 -
td(off) Turn-off Delay Time - 90 -
tfFall Time
(VDD=250V, ID=4.5A, RG=50Ω,
RD=79Ω)(*4)
-45-
ns
QgTotal Gate Charge - - 38
Qgs Gate-Source Charge - - 5
Qgd Gate-Drain Charge
(VDS=400V, ID=3.1 A, VGS=10V)
(*4) --22
nC
LDInternal Drain Inductance (Measured from the drain lead 0.25” from
package to center of die) -4.5-nH
LSInternal Source Inductance (Measured from the drain lead 0.25” from
package to source bond pad) -7.5-nH
*4: Pulse Test: Pulse Width≤300us, Duty Cycl e≤2%
Source-Drain Diode
Symbol Characteristic Min. Typ. Max. Units
Qrr Reverse Recovery Charge - 1 2 uC
ton Forward Turn-On Ti me - ** -
trr Reverse Recovery Time
IF=3.1A, di/dt=100A/us, Tj=25°C
(*4) - 320 640 ns
VSD Diode Forward Voltage IS=4.5A, VGS=0V, Tj=25°C (*4) --1.6V
**: Negligibl e, Dominated by circui t inductance