CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 2:12 Low Additive Jitter LVDS Buffer Check for Samples: CDCLVD1212 FEATURES 1 * * * * * * * * * * * * 2:12 Differential Buffer Low Additive Jitter: <300 fs RMS in 10 kHz to 20 MHz Low Output Skew of 50 ps (Max) Universal Inputs Accept LVDS, LVPECL, LVCMOS Selectable Clock Inputs Through Control Pin 12 LVDS Outputs, ANSI EIA/TIA-644A Standard Compatible Clock Frequency up to 800 MHz 2.375-2.625 V Device Power Supply LVDS Reference Voltage, VAC_REF, Available for Capacitive Coupled Inputs Industrial Temperature Range -40C to 85C Packaged in 6mm x 6mm 40-Pin QFN (RHA) ESD Protection Exceeds 3 kV HBM, 1 kV CDM The CDCLVD1212 clock buffer distributes one of two selectable clock inputs (IN0, IN1) to 12 pairs of differential LVDS clock outputs (OUT0, OUT11) with minimum skew for clock distribution. The CDCLVD1212 can accept two clock sources into an input multiplexer. The inputs can either be LVDS, LVPECL, or LVCMOS. The CDCLVD1212 is specifically designed for driving 50 transmission lines. If driving the inputs in single ended mode, the appropriate bias voltage (VAC_REF) should be applied to the unused negative input pin. The IN_SEL pin selects the input which is routed to the outputs. If this pin is left open it disables the outputs (static). The part supports a fail safe function. It incorporates an input hysteresis, which prevents random oscillation of the outputs in absence of an input signal. The device operates in 2.5 V supply environment and is characterized from -40C to 85C (ambient temperature). The CDCLVD1212 is packaged in small 40-pin, 6mm x 6mm QFN package. APPLICATIONS * * * * * DESCRIPTION Telecommunications/Networking Medical Imaging Test and Measurement Equipment Wireless Communications General Purpose Clocking 125 MHz 125 MHz Oscillator CDCLVD1212 LVDS Buffer PHY2 PHY2 PHY2 PHY2 2 PHY2 PHY2 PHY 12 PHY2 IN_ SEL Figure 1. Application Example 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright (c) 2010-2011, Texas Instruments Incorporated CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. VCC VAC_REF0 VCC VCC VCC VCC VCC Reference Generator VAC_REF1 IN_MUX INP0 INN0 INP1 OUTP [0..11] LVDS OUTN [0..11] INN1 VCC 200 kW IN_SEL 200 kW GND GND Figure 2. CDCLVD1212 Block Diagram 2 VCC 31 OUTP8 32 GND OUTN7 OUTP7 OUTN6 OUTP6 OUTN5 OUTP5 OUTN4 OUTP4 GND CDCLVD1212 (TOP VIEW) 30 29 28 27 26 25 24 23 22 21 6mm x 6mm 40 pin QFN (RHA) 20 VCC 19 OUTN3 OUTN8 33 18 OUTP3 OUTP9 34 17 OUTN2 OUTN9 35 16 OUTP2 OUTP10 36 15 OUTN1 OUTN10 37 14 OUTP1 OUTP11 38 13 OUTN0 OUTN11 39 12 OUTP0 VCC 40 11 VCC 1 2 3 4 5 6 7 8 9 10 IN_SEL INP1 INN1 VAC_REF1 VCC VCC VAC_REF0 INN0 INP0 N.C. Thermal Pad (GND) Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 PIN FUNCTIONS PIN NAME NO. TYPE VCC 5, 6, 11, 20, 31, 40 Power 2.5V supplies for the device GND 21, 30 Ground Device ground INP0, INN0 9, 8 Input Differential input pair or single ended input INP1, INN1 2, 3 Input Differential redundant input pair or single ended input OUTP0, OUTN0 12, 13 Output Differential LVDS output pair no. 0 OUTP1, OUTN1 14, 15 Output Differential LVDS output pair no. 1 OUTP2, OUTN2 16, 17 Output Differential LVDS output pair no. 2 OUTP3, OUTN3 18, 19 Output Differential LVDS output pair no. 3 OUTP4, OUTN4 22, 23 Output Differential LVDS output pair no. 4 OUTP5, OUTN5 24, 25 Output Differential LVDS output pair no. 5 OUTP6, OUTN6 26, 27 Output Differential LVDS output pair no. 6 OUTP7, OUTN7 28, 29 Output Differential LVDS output pair no. 7 OUTP8,OUTN8 32, 33 Output Differential LVDS output pair no. 8 OUTP9,OUTN9 34, 35 Output Differential LVDS output pair no. 9 OUTP10,OUTN10 36, 37 Output Differential LVDS output pair no. 10 OUTP11,OUTN11 38, 39 Output Differential LVDS output pair no. 11 VAC_REF0 7 Output Bias voltage output for capacitive coupled inputs. If used, it is recommended to use a 0.1F to GND on this pin VAC_REF1 4 Output Bias voltage output for capacitive coupled inputs. If used, it is recommended to use a 0.1F to GND on this pin. N.C. 10 IN_SEL DESCRIPTION No connect Input with an internal 200k pull-up and pull-down 1 Thermal Pad Input selection - selects input port; (See Table 1) Device ground. Thermal pad must be soldered to ground. See thermal management recommendations Ground Table 1. Input Selection Table (1) IN_SEL ACTIVE CLOCK INPUT 0 INP0, INN0 1 INP1, INN1 Open None (1) The input buffers are disabled and the outputs are static. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) Supply voltage range, VCC VALUE UNIT -0.3 to 2.8 V Input voltage range, VI -0.2 to (VCC + 0.2) V Output voltage range, VO -0.2 to (VCC + 0.2) V Driver short circuit current, IOSD See Note Electrostatic discharge (Human Body Model, 1.5 k, 100 pF) (1) (2) >3000 (2) V Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The outputs can handle permanent short. Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 3 CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com RECOMMENDED OPERATING CONDITIONS Device supply voltage, VCC Ambient temperature, TA MIN TYP MAX 2.375 2.5 2.625 V 85 C -40 UNIT THERMAL INFORMATION CDCLVD1212 THERMAL METRIC (1) RHA (40 PINS) qJA Junction-to-ambient thermal resistance 31.0 qJC(top) Junction-to-case(top) thermal resistance 28.7 qJB Junction-to-board thermal resistance 9.3 yJT Junction-to-top characterization parameter 0.4 yJB Junction-to-board characterization parameter 9.3 qJC(bottom) Junction-to-case(bottom) thermal resistance 3.1 (1) UNITS C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. ELECTRICAL CHARACTERISTICS At VCC = 2.375V to 2.625V, TA = -40C to 85C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IN_SEL CONTROL INPUT CHARACTERISTICS VdI3 3 State Open VdIH Input high voltage VdIL Input low voltage IdIH Input high current VCC = 2.625 V, VIH = 2.625 V IdIL Input low current VCC = 2.625 V, VIL = 0 V Rpull(IN_SEL) Input pull-up/ pull-down resistor 0.5xVCC V 0.7xVCC V 0.2xVCC V 30 mA -30 mA 200 k 2.5V LVCMOS (see Figure 7) INPUT CHARACTERISTICS fIN Input frequency External threshold voltage applied to complementary input Vth Input threshold voltage VIH Input high voltage VIL Input low voltage IIH Input high current VCC = 2.625 V, VIH = 2.625 V IIL Input low current VCC = 2.625 V, VIL = 0 V V/T Input edge rate 20%-80% CIN Input capacitance 200 MHz 1.1 1.5 V Vth + 0.1 VCC V 0 Vth - 0.1 V 10 mA -10 mA 1.5 V/ns 2.5 pF DIFFERENTIAL INPUT CHARACTERISTICS fIN VIN, Input frequency Clock input 800 MHz VPP Differential input voltage peak-to-peak VICM = 1.25 V 0.3 1.6 VICM Input common mode voltage range VIN, DIFF, PP > 0.4 V 1.0 VCC - 0.3 V IIH Input high current VCC = 2.625 V, VIH = 2.625 V 10 mA IIL Input low current VCC = 2.625, VIL = 0 V V/T Input edge rate 20%-80% CIN Input capacitance 2.5 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated 4 DIFF Product Folder Link(s): CDCLVD1212 -10 0.75 mA V/ns pF CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 ELECTRICAL CHARACTERISTICS (continued) At VCC = 2.375V to 2.625V, TA = -40C to 85C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 250 450 mV -15 15 mV 1.1 1.375 -15 15 LVDS OUTPUT CHARACTERISTICS |VOD| Differential output voltage magnitude VOD Change in differential output voltage magnitude VOC(SS) Steady-state common mode output voltage VOC(SS) Steady-state common mode output voltage VIN, DIFF, PP = 0.6V, RL = 100 Vring Output overshoot and undershoot Percentage of output amplitude VOD VOS Output ac common mode VIN, DIFF, PP = 0.6V, RL = 100 IOS Short-circuit output current VOD = 0 V tPD Propagation delay VIN, DIFF, PP = 0.3 V tSK, PP Part-to-part skew tSK, O Output skew tSK,P Crossing-point-to-crossing-point Pulse skew(with 50% duty cycle input) distortion tRJIT Random additive jitter (with 50% duty cycle input) Edge speed 0.75 V/ns, 10 kHz - 20 MHz tR/tF Output rise/fall time 20% to 80%, 100 , 5 pF ICCSTAT Static supply current Outputs unterminated, f = 0 Hz ICC100 Supply current All outputs, RL = 100 , f = 100 MHz ICC800 Supply current All outputs, RL = 100 , f = 800 MHz VIN, DIFF, PP = 0.3V, RL = 100 V mV 10% 40 70 mVPP 24 mA 2.5 ns 600 ps 50 ps 50 ps 0.3 ps, RMS 300 ps 17 28 mA 85 110 mA 117 146 mA 1.25 1.35 V 1.5 -50 50 VAC_REF CHARACTERISTICS VAC_REF Reference output voltage VCC = 2.5 V, Iload = 100 A 1.1 Typical Additive Phase Noise Characteristics for 100 MHz Clock PARAMETER MIN TYP MAX UNIT phn100 Phase noise at 100 Hz offset -132.9 dBc/Hz phn1k Phase noise at 1 kHz offset -138.8 dBc/Hz phn10k Phase noise at 10 kHz offset -147.4 dBc/Hz phn100k Phase noise at 100 kHz offset -153.6 dBc/Hz phn1M Phase noise at 1 MHz offset -155.2 dBc/Hz phn10M Phase noise at 10 MHz offset -156.2 dBc/Hz phn20M Phase noise at 20 MHz offset -156.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 171 fs, RMS Typical Additive Phase Noise Characteristics for 737.27 MHz Clock PARAMETER phn100 Phase noise at 100 Hz offset phn1k Phase noise at 1 kHz offset phn10k Phase noise at 10 kHz offset phn100k MIN TYP MAX UNIT -80.2 dBc/Hz -114.3 dBc/Hz -138 dBc/Hz Phase noise at 100 kHz offset -143.9 dBc/Hz phn1M Phase noise at 1 MHz offset -145.2 dBc/Hz phn10M Phase noise at 10 MHz offset -146.5 dBc/Hz phn20M Phase noise at 20 MHz offset -146.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 65 fs, RMS Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 5 CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com TYPICAL CHARACTERISTICS Phase Noise - dBc/Hz INPUT- AND OUTPUT-CLOCK PHASE NOISES vs FREQUENCY FROM the CARRIER (TA = 25C and VCC = 2.5V) Input clock RMS jitter is 32 fs from 10 kHz to 20 MHz and additive RMS jitter is 152 fs Figure 3. 100 MHz Input and Output Phase Noise Plot 6 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 TYPICAL CHARACTERISTICS (continued) Differential Output Voltage vs Frequency VOD - Differential Output Voltage - mV 350 TA = 25oC 340 2.625V 330 320 2.5V 310 300 2.375V 290 280 270 260 250 0 100 200 300 400 500 600 700 800 Frequency - MHz Figure 4. TEST CONFIGURATIONS LVDS Oscilloscope 100 W Figure 5. LVDS Output DC Configuration During Device Test Phase Noise Analyzer LVDS 50 W Figure 6. LVDS Output AC Configuration During Device Test Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 7 CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) VIH Vth IN VIL IN Vth Figure 7. DC Coupled LVCMOS Input During Device Test VOH OUTNx VOD OUTPx VOL 80% VOUT,DIFF,PP (= 2 x VOD) 20% 0V tr tf Figure 8. Output Voltage and Rise/Fall Time 8 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 TYPICAL CHARACTERISTICS (continued) INNx INPx OUTN0 tPLH0 tPHL0 tPLH1 tPHL1 OUTP0 OUTN1 OUTP1 OUTN2 tPLH2 tPHL2 OUTP2 OUTN11 tPHL11 tPLH11 OUTP11 A. Output skew is calculated as the greater of the following: As of the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, ..11) B. Part to part skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, ..11) Figure 9. Output Skew and Part-to-Part Skew Vring OUTNx VOD 0 V Differential OUTPx Figure 10. Output Overshoot and Undershoot Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 9 CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) VOS GND Figure 11. Output AC Common Mode APPLICATION INFORMATION THERMAL MANAGEMENT For reliability and performance reasons, the die temperature should be limited to a maximum of 125C. The device package has an exposed pad that provides the primary heat removal path to the printed circuit board (PCB). To maximize the heat dissipation from the package, a thermal landing pattern including multiple vias to a ground plane must be incorporated into the PCB within the footprint of the package. The thermal pad must be soldered down to ensure adequate heat conduction to of the package. Check the mechanical data at the end of the data sheet for land and via pattern examples. POWER SUPPLY FILTERING High-performance clock buffers are sensitive to noises on the power supply, which can dramatically increase the additive jitter of the buffer. Thus, it is essential to reduce noise from the system power supply, especially when jitter/phase noise is critical to the application. Filter capacitors are used to eliminate the low-frequency noise from the power supply, where the bypass capacitors provide the very low impedance path for high-frequency noise and guard the power-supply system against the induced fluctuations. These bypass capacitors also provide instantaneous current surges as required by the device and should have low equivalent series resistance (ESR). To properly use the bypass capacitors, they must be placed close to the power-supply pins and laid out with short loops to minimize inductance. It is recommended to add as many high-frequency (for example, 0.1 mF) bypass capacitors as there are supply pins in the package. It is recommended, but not required, to insert a ferrite bead between the board power supply and the chip power supply that isolates the high-frequency switching noises generated by the clock driver; these beads prevent the switching noise from leaking into the board supply. Choose an appropriate ferrite bead with low dc resistance because it is imperative to provide adequate isolation between the board supply and the chip supply, as well as to maintain a voltage at the supply pins that is greater than the minimum voltage required for proper operation. Board Supply Chip Supply Ferrite Bead 1 F 10F 0.1 F (x6) Figure 12. Power Supply Filtering 10 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 LVDS OUTPUT TERMINATION The proper LVDS termination for signal integrity over two 50 lines is 100 between the outputs on the receiver end. Either dc-coupled termination or ac-coupled termination can be used for LVDS outputs. It is recommended to place termination resister close to the receiver. If the receiver is internally biased to a voltage different than the output common mode voltage of the CDCLVD1212, ac-coupling should be used. If the LVDS receiver has internal 100 termination, external termination must be omitted. Unused outputs can be left open without connecting any trace to the output pins. Z = 50 W 100 W CDCLVD1212 LVDS Z = 50 W Figure 13. LVDS Output DC Termination 100 nF Z = 50 W 100 W CDCLVD1212 LVDS Z = 50 W 100 nF Figure 14. LVDS Output AC Termination with Receiver Internally Biased Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 11 CDCLVD1212 SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 www.ti.com INPUT TERMINATION The CDCLVD1212 inputs can be interfaced with LVDS, LVPECL, or LVCMOS drivers. LVDS Driver can be connected to CDCLVD1212 inputs with dc or ac coupling as shown Figure 15 and Figure 16 respectively. Z = 50 W 100 W LVDS CDCLVD1212 Z = 50 W Figure 15. LVDS Clock Driver Connected to CDCLVD1212 Input (DC coupled) 100 nF Z = 50 W LVDS CDCLVD1212 Z = 50 W 100 nF 50 W 50 W VAC_REF Figure 16. LVDS Clock Driver Connected to CDCLVD1212 Input (AC coupled) Figure 17 shows how to connect LVPECL inputs to the CDCLVD1212. The series resistors are required to reduce the LVPECL signal swing if the signal swing is >1.6 VPP. 75 W 100 nF Z = 50 W CDCLVD1212 LVPECL Z = 50 W 75 W 150 W 150 W 100 nF 50 W 50 W VAC_REF Figure 17. LVPECL Clock Driver Connected to CDCLVD1212 Input 12 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 CDCLVD1212 www.ti.com SCAS901B - SEPTEMBER 2010 - REVISED JANUARY 2011 Figure 18 illustrates how to couple a 2.5 V LVCMOS clock input to the CDCLVD1212 directly. The series resistance (RS) should be placed close to the LVCMOS driver if needed. 3.3 V LVCMOS clock input swing needs to be limited to VIH VCC. RS LVCMOS (2.5V) Z = 50 W CDCLVD1212 V V Vth = IH + IL 2 Figure 18. 2.5V LVCMOS Clock Driver Connected to CDCLVD1212 Input For unused inputs, it is recommended to ground both input pins (INP, INN) using 1 k resistors. SPACER REVISION HISTORY Changes from Original (September 2010) to Revision A * Page Deleted the Recommended PCB Layout illustration .......................................................................................................... 10 Changes from Revision A (November 2010) to Revision B * Page Changed the device status From: Product Preview To: Production ..................................................................................... 1 Submit Documentation Feedback Copyright (c) 2010-2011, Texas Instruments Incorporated Product Folder Link(s): CDCLVD1212 13 PACKAGE OPTION ADDENDUM www.ti.com 5-Feb-2011 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/ Ball Finish MSL Peak Temp (3) CDCLVD1212RHAR ACTIVE VQFN RHA 40 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR CDCLVD1212RHAT ACTIVE VQFN RHA 40 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR Samples (Requires Login) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. 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Addendum-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 16-Feb-2012 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant CDCLVD1212RHAR VQFN RHA 40 2500 330.0 16.4 6.3 6.3 1.5 12.0 16.0 Q2 CDCLVD1212RHAT VQFN RHA 40 250 330.0 16.4 6.3 6.3 1.5 12.0 16.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 16-Feb-2012 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) CDCLVD1212RHAR VQFN RHA 40 2500 336.6 336.6 28.6 CDCLVD1212RHAT VQFN RHA 40 250 336.6 336.6 28.6 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. 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