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TO SHIBA Bipolar Linear Integr ated Circuit Silicon Monolith ic
TA75W393FU
Dual Voltage Comparator
This device consist of two independent voltage comparators that
designed to operate from a single power supply over a wide range of
voltage.
Normal operation from dual supplies is also to be guaranteed on
voltage range from ± 1V to ± 18V.
VCC is necessary at least more 1.5V volts than the input common
mode voltage.
The output can be connected to other open collector outputs to
achieve Wired-OR relation ship.
Features
Compatible to TA75393F.
Single supply voltage range or dual supplies : 2VDC to 36VDC or ± 1VDC to ± 18VDC
Low supply current : 0.8mA (typ.)
Low input offset voltage : ±2mV (typ.)
Wide input common mode voltage range : 0VDC to VCC − 1.5VDC
Output compatible with TTL, DTL, MOS and CMOS logic system.
The output can be connected to achieve Wired-OR relation..
Marking (Top View) Pin Connection (Top View)
Weight : 0.02 1g (ty p.)
Start of commercial production
1991-08
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Equivalent Circuit
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Symbol Rating Unit
Supply voltage VCC, VEE ±18 or 36 V
Different i al input voltage DVIN
±36 V
Input volt age VIN +0.3 to VCC V
Power dissipation PD 250 mW
Operating temperature Topr −40 to 85 °C
Storage temperature Tstg −55 to 125 °C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Electrical Characteristics (Unless otherwise specified VCC = 5V, VEE = GND, Ta = 25°C)
Characteristic Symbol Test
Circuit
Test Condition Min Typ. Max Unit
Input offset voltage VIO 1 ― ― 2 5 mV
Input offset current IIO 2 ― ― 5 50 nA
Input bias current II 2 ― ― 25 250 nA
Common mode input voltage CMVIN ― ― 0 ― VCC−1.5 V
Supply current ICC 3 No load ― 0.8 2 mA
Voltage gain GV ― RL = 15k Ω ― 200 ― V/mV
Sink current Isink 4 IN (+) = 0VDC, I N (−) = 1VDC
VOL = 1.5V 6 16 ― mA
Output Voltage (“L” Level) VOL 5 IN (+) = 0VDC, IN (−) = 1VDC
Isink = 3mA ― 0.2 0.4 V
Output Leak Current ILEAK ― IN (+) = 1VDC, IN ( −) = 0V DC
VO = 5VDC ― 0.1 ― nA
Response Time trsp 6 RL = 5.1kΩ, CL = 15pF ― 1.3 ― μs
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Test Circuit
(1) VIO (2) II, IIO
(3) ICC (4) Isink
(5) VOL (6 ) trsp
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Package Dimensions
SSOP8-P-0.65 Unit: mm
Weight : 0.02 1g (ty p.)
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