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October 2013
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
1
FDP060AN08A0 / FDB060AN08A0
Features
Formerly developmental type 82680
Applications
TO-220
GDS
G
S
D
MOSFET Maximum Ratings TC = 25°C unless otherwise noted
N-Channel PowerTrench® MOSFET
75 V, 80 A, 6 mΩ
RDS(on) = 4.8 m ( Typ.) @ VGS = 10 V, ID = 80 A
QG(tot) = 73 nC ( Typ.) @ VGS = 10 V
Low Miller Charge
Low Qrr Body Diode
UIS Capability (Single Pulse and Repetitive Pulse)
Synchronous Rectification for ATX / Server / Telecom PSU
Motor drives and Uninterruptible Power Supplies
Battery Protection Circuit
GS
D
D2-PAK
Thermal Resistance Junction to Ambient, Max. D2-PAK, 1in2 copper pad area
Thermal Resistance Junction to Ambient, Max. TO-220, D2-PAK (Note 2)
Thermal Resistance Junction to Case, Max. TO-220, D2-PAK 0.58
FDP060AN08A0
FDB060AN08A0
Symbol Parameter Unit
Thermal Characteristics
VDSS Drain to Source Voltage 75 V
VGS Gate to Source Voltage ±20 V
ID
80 A
Drain Current
Continuous (TC < 127oC, VGS = 10V)
Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 43oC/W) 16 A
Pulsed Figure 4 A
EAS Single Pulse Avalanche Energy (Note 1) 350 mJ
PD
Power dissipation 255 W
Derate above 25oC1.7
oCW/
TJ, TSTG Operating and Storage Temperature -55 to 175 oC
RθJC oC/W
RθJA oC/W
RθJA 43 oC/W
62
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
2
Package Marking and Ordering Information
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
Symbol Parameter Test Conditions Min Typ Max Unit
Electrical Characteristics TC = 25°C unless otherwise noted
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics (VGS = 10V)
Drain-Source Diode Characteristics
Notes:
1: Starting TJ = 25°C, L = 109µH, IAS = 80A.
2: Pulse width = 100s
Device Marking Device Package Reel Size Tape Width Quantity
FDB060AN08A0 FDB060AN08A0 D2-PAK 330 mm 24 mm 800 units
FDP060AN08A0 FDP060AN08A0 TO-220 Tube N/A 50 units
BVDSS Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 75 - - V
IDSS Zero Gate Voltage Drain Current VDS = 60V - - 1 µA
VGS = 0V -TC = 150oC -250
IGSS Gate to Source Leakage Current VGS = ±20V - - ±100 nA
VGS(TH) Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
rDS(ON) Drain to Source On Resistance
ID = 80A, VGS = 10V - 0.0048 0.006
ID = 40A, VGS = 6V - 0.0066 0.010
ID = 80A, VGS = 10V,
TJ = 175oC- 0.010 0.013
CISS Input Capacitance VDS = 25V, VGS = 0V,
f = 1MHz
- 5150 - pF
COSS Output Capacitance - 800 - pF
CRSS Reverse Transfer Capacitance - 230 - pF
Qg(TOT) Total Gate Charge at 10V VGS = 0V to 10V
VDD = 40V
ID = 80A
Ig = 1.0mA
73 95 nC
Qg(TH) Threshold Gate Charge VGS = 0V to 2V - 10 13 nC
Qgs Gate to Source Gate Charge - 29 - nC
Qgs2 Gate Charge Threshold to Plateau - 19 - nC
Qgd Gate to Drain “MillerCharge - 16 - nC
tON Turn-On Time
VDD = 40V, ID = 80A
VGS = 10V, RGS = 3.9
--147ns
td(ON) Turn-On Delay Time - 19 - ns
trRise Time - 79 - ns
td(OFF) Turn-Off Delay Time - 37 - ns
tfFall Time - 38 - ns
tOFF Turn-Off Time - - 113 ns
VSD Source to Drain Diode Voltage ISD = 80A - - 1.25 V
ISD = 40A - - 1.0 V
trr Reverse Recovery Time -ISD = 75A, dISD/dt = 100A/µs - 37ns
QRR Reverse Recovered Charge -ISD = 75A, dISD/dt = 100A/µs - 38nC
3
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
Typical Characteristics TC = 25°C unless otherwise noted
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
Figure 2. Maximum Continuous Drain Current vs
Case Temperature
t, RECTANGULAR PULSE DURATION (s)
Figure 3. Normalized Maximum Transient Thermal Impedance
t, PULSE WIDTH (s)
Figure 4. Peak Current Capability
TC, CASE TEMPERATURE (oC)
POWER DISSIPATION MULTIPLIER
0
0 52 5075100 175
0.2
0.4
0.6
0.8
1.0
1.2
125 150
0
25
50
75
100
125
150
25 50 75 100 125 150 175
ID, DRAIN CURRENT (A)
TC, CASE TEMPERATURE (oC)
CURRENT LIMITED
BY PACKAGE
0.1
1
10-5 10-4 10-3 10-2 10-1 100101
0.01
2
ZθJC, NORMALIZED
THERMAL IMPEDANCE
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJC x RθJC + TC
PDM
t1
t2
0.5
0.2
0.1
0.05
0.01
0.02
DUTY CYCLE - DESCENDING ORDER
SINGLE PULSE
100
1000
2000
70
IDM, PEAK CURRENT (A)
10-5 10-4 10-3 10-2 10-1 100101
TC = 25oC
I = I25 175 - TC
150
FOR TEMPERATURES
ABOVE 25oC DERATE PEAK
CURRENT AS FOLLOWS:
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
VGS = 10V
4
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
Typical Characteristics TC = 25°C unless otherwise noted
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 5. Forward Bias Safe Operating Area NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
VGS , GATE TO SOURCE VOLTAGE (V)
Figure 7. Transfer Characteristics
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 8. Saturation Characteristics
Figure 9. Drain to Source On Resistance vs Drain
Current
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
0.1
1
10
100
1000
110100
ID, DRAIN CURRENT (A)
TJ = MAX RATED
TC = 25oC
SINGLE PULSE
LIMITED BY rDS(ON)
AREA MAY BE
OPERATION IN THIS
10µs
1ms
DC
100µs
10ms
1
10
100
0.01 0.1 1 10 100
500
IAS, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
STARTING TJ = 25oC
STARTING TJ = 150oC
tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD)
If R = 0
If R 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1]
0
25
50
75
100
125
150
175
3.5 4.0 4.5 5.0 5.5 6.0
ID, DRAIN CURRENT (A)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDD = 15V
TJ = 175oC
TJ = 25oC TJ = -55oC
0
25
50
75
100
125
150
175
0 0.5 1.0 1.5 2.0
ID, DRAIN CURRENT (A)
VGS = 6V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 5V
TC = 25oC
VGS = 10V VGS = 7V
4.0
4.5
5.0
5.5
6.0
6.5
7.0
7.5
0 02 608040
ID, DRAIN CURRENT (A)
VGS = 6V
VGS = 10V
DRAIN TO SOURCE ON RESISTANCE(m)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0.5
1.0
1.5
2.0
2.5
-80 -40 0 40 80 120 160 200
NORMALIZED DRAIN TO SOURCE
TJ, JUNCTION TEMPERATURE (oC)
ON RESISTANCE
VGS = 10V, ID = 80A
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
5
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
Typical Characteristics TC = 25°C unless otherwise noted
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
Figure 11. Normalized Gate Threshold Voltage vs
Junction Temperature
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
Figure 13. Capacitance vs Drain to Source
Voltage
Figure 14. Gate Charge Waveforms for Constant
Gate Current
0.4
0.6
0.8
1.0
1.2
-80 -40 0 40 80 120 160 200
VGS = VDS, ID = 250µA
TJ, JUNCTION TEMPERATURE (oC)
NORMALIZED GATE
THRESHOLD VOLTAGE
0.9
1.0
1.1
1.2
-80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC)
ID = 250µA
NORMALIZED DRAIN TO SOURCE
BREAKDOWN VOLTAGE
100
1000
0.1 1 10
7000
75
C, CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
CISS = CGS + CGD
COSS CDS + CGD
CRSS = CGD
0
2
4
6
8
10
0 02 6080
VGS , GATE TO SOURCE VOLTAGE (V)
40
Qg, GATE CHARGE (nC)
VDD = 40V
ID = 80A
ID = 16A
WAVEFORMS IN
DESCENDING ORDER:
6
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
Test Circuits and Waveforms
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
tP
VGS
0.01
L
IAS
+
-
VDS
VDD
RG
DUT
VARY tP TO OBTAIN
REQUIRED PEAK IAS
0V
VDD
VDS
BVDSS
tP
IAS
tAV
0
VGS +
-
VDS
VDD
DUT
Ig(REF)
L
VDD
Qg(TH)
VGS = 2V
Qgs2
Qg(TOT)
VGS = 10V
VDS VGS
Ig(REF)
0
0
Qgs Qgd
VGS
RL
RGS
DUT
+
-
VDD
VDS
VGS
tON
td(ON)
tr
90%
10%
VDS
90%
10%
tf
td(OFF)
tOFF
90%
50%
50%
10% PULSE WIDTH
VGS
0
0
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
7
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, PDM, in an
application. Therefore the application’s ambient
temperature, TA (oC), and thermal resistance RθJA (oC/W)
must be reviewed to ensure that TJM is never exceeded.
Equation 1 mathematically represents the relationship and
serves as the basis for establishing the rating of the part.
In using surface mount devices such as the TO-263
package, the environment in which it is applied will have a
significant influence on the part’s current and maximum
power dissipation ratings. Precise determination of PDM is
complex and influenced by many factors:
1. Mounting pad area onto which the device is attached and
whether there is copper on one side or both sides of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the part,
the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 21
defines the RθJA for the device as a function of the top
copper (component side) area. This is for a horizontally
positioned FR-4 board with 1oz copper after 1000 seconds
of steady state power with no air flow. This graph provides
the necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice thermal model or manually utilizing the normalized
maximum transient thermal impedance curve.
Thermal resistances corresponding to other copper areas
can be obtained from Figure 21 or by calculation using
Equation 2 or 3. Equation 2 is used for copper area defined
in inches square and equation 3 is for area in centimeters
square. The area, in square inches or square centimeters is
the top copper area including the gate and source pads.
(EQ. 1)
PDM
TT()
RθJA
=----------
JM
------------------
A-
Area in Inches Squared
(EQ. 2)
RθJA 26.51
0.262 +Area()
+-----------------
19.
----
84
----------------=
(EQ. 3)
RθJA 26.51 -----
12
----
8
1.69 +Area()
+------------ -------------
=
Area in Centimeters Squared
Figure 21. Thermal Resistance vs Mounting
Pad Area
20
40
60
80
10
0.1
RθJA = 26.51+ 19.84/(0.262+Area) EQ.2
RθJA (oC/W)
1
(6.45)
AREA, TOP COPPER AREA in2 (cm2)
(0.645) (64.5)
RθJA = 26.51+ 128/(1.69+Area) EQ.3
8
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
PSPICE Electrical Model
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
.SU BC K T F DP060AN08A0 2 1 3 ; rev October 2002
Ca 1 2 8 2. 5e-9
Cb 1 5 14 2. 1e-9
Cin 6 8 4.7e-9
D bo dy 7 5 DbodyM OD
Dbreak 5 11 D break MO D
Dplc ap 10 5 Dplcap M OD
Ebreak 11 7 17 18 82.1
Ed s 1 4 8 5 8 1
Eg s 1 3 8 6 8 1
Esg 6 10 6 8 1
Evthres 6 21 19 8 1
Evtem p 20 6 18 22 1
It 8 17 1
Lgat e 1 9 5.3e-9
Ldrai n 2 5 1.0e-9
Ls o urc e 3 7 5e -9
RLgate 1 9 53
R Ld rain 2 5 10
RLsource 3 7 50
Mm e d 1 6 6 8 8 M m e dM OD
Mstro 16 6 8 8 MstroM OD
Mwe ak 16 21 8 8 Mwea kM OD
Rbreak 17 18 RbreakM O D 1
Rdrain 50 16 RdrainMOD 9e-4
Rgate 9 20 1.4
RSLC1 5 51 RSL CM O D 1e-6
RSLC2 5 50 1e3
Rsource 8 7 RsourceMOD 3e-3
Rvthres 22 8 RvthresMOD 1
Rvtemp 18 19 RvtempMOD 1
S1a 6 12 13 8 S1AMOD
S1b 13 12 13 8 S1BMOD
S2a 6 15 14 13 S2AMOD
S2b 13 15 14 13 S2BMOD
Vbat 22 19 DC 1
ESL C 51 50 VALUE ={(V(5,5 1)/AB S( V(5,51))) * (P WR(V(5,51 )/ (1e-6*350 ),5))}
.MODEL DbodyMOD D (IS=2E-11 N=1.04 RS=1.76e-3 TRS1=2.7e-3 TRS2=1e-6
+ CJO=3. 2e-9 M=5.6e-1 TT= 3e-10 XTI=3.9)
.MO DE L Dbrea kM OD D (R S= 3e-1 TRS 1=1e-3 TRS2=-8.9e-6)
.MODEL DplcapMOD D (CJO=1.56e-9 IS=1e-30 N=10 M=0.53)
.MODEL MmedMOD NMOS (VTO=3.6 KP=6 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.4)
.MO DE L Mst roMOD NMOS (VTO=4.22 K P = 220 IS=1e -30 N=10 T OX=1 L=1u W=1u)
.MODEL MweakMOD NMOS (VTO=3 KP=0.03 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=14 RS=0.1)
.MODEL RbreakMOD RES (TC1=9.4e-4 TC2=-9e-7)
.MO DE L RdrainMOD RE S (TC 1=2.2e-2 T C2=6e -5)
.MODEL RSLCMOD RES (TC1=2e-3 TC2=1e-5)
.MO DE L Rsou rc eMOD RES (T C1=1e-3 TC2=1e-6 )
.MO DEL Rvthre sMO D RES (T C1=-6e-3 TC 2= -1.6e-5)
.MO DE L Rvtem pMOD RES (TC1=-2. 4e-3 TC 2=1e-6)
.M ODEL S1AMOD VSWITC H (RON= 1e- 5 ROFF =0. 1 VON=- 8 VOF F=-5 )
.M ODEL S1BMOD VSWITC H (RON= 1e- 5 ROFF =0. 1 VON=- 5 VOF F=-8 )
.M ODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 4 VOFF =-3 .5 )
.M ODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF =0. 1 VON=- 3. 5 VOF F=-4 )
.ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IE EE P ower E le ct ronic s S pecial i st Conference Records, 1991, written by Wi lliam J. Hepp and C. F rank
Wheatley.
18
22
+-
6
8
+
-
5
51
+
-
19
8
+-
17
18
6
8
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
8
14
13
MWEAK
EBREAK DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ESLC
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE
EVTEMP
9
ESG
LGATE
RLGATE
20
+
-
++
--
+
-
6
9
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
SABER Electrical Model
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
rev October 2002
tem pl ate FDP060AN08A0 n2,n1,n3
electrical n2,n1,n3
{
var i is cl
dp..model dbodymod = (isl=2e-11,nl=1.04,rs=1.76e-3,trs1=2.7e-3,trs2=1e-6,cjo=3.2e-9,m=5.6e-1,tt=3e-10,xti=3.9)
dp.. m odel dbreakmo d = (rs=3e-1, trs1=1e-3 ,trs2=-8.9e-6)
dp..model dplcapmod = (cjo=1.56e-9,isl=10e-30,nl=10,m=0.53)
m..model mmedmod = (type=_n,vto=3.6,kp=6,is=1e-30, tox=1)
m..model mstrongmod = (type=_n,vto=4.22,kp=220,is=1e-30, tox=1)
m..model mweakmod = (type=_n,vto=3,kp=0.03,is=1e-30, tox=1,rs=0.1)
sw_v cs p..mo del s1bmo d = (ron=1e- 5,roff =0.1,vo n=-5,vof f=-8 )
sw_v cs p..mo del s2amo d = (ron=1e- 5,roff =0.1,vo n=-4,vof f=-3 .5 )
sw_v cs p..mo del s2bmo d = (ron=1e- 5,roff =0.1,vo n=-3.5,voff= -4)
c . ca n 1 2 n8 = 2.5e- 9
c.cb n15 n14 = 2.1e-9
c.c in n6 n8 = 4.7e-9
dp.dbody n7 n5 = model=dbody m od
dp.dbreak n5 n11 = model=dbr eakmod
dp.dplca p n10 n5 = model=dplcapmod
spe. ebreak n11 n7 n17 n1 8 = 82.1
spe. eds n14 n8 n5 n8 = 1
spe. egs n13 n8 n6 n8 = 1
spe. esg n6 n10 n6 n8 = 1
spe.evthres n6 n21 n19 n8 = 1
spe. evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
l.lg ate n1 n9 = 5.3e-9
l.ldrain n2 n5 = 1.0e-9
l.lsource n3 n7 = 5e-9
res. rl gate n1 n9 = 53
res. rl drain n2 n5 = 10
res. rl source n3 n7 = 50
m.mmed n16 n6 n8 n8 = m odel=m m edmod, l= 1u, w=1u
m.ms t rong n16 n6 n8 n8 = m odel=m strongmod, l= 1u, w=1 u
m.mw eak n16 n21 n8 n8 = model=m wea kmod, l=1u , w = 1u
res. rbreak n17 n18 = 1, tc1 =9.4e-4, tc 2=-9e-7
res. rdrain n50 n16 = 9e-4, tc 1=2.2e-2,tc2 =6e-5
r e s .rgate n9 n20 = 1.4
res. rslc1 n5 n51 = 1e-6, tc1 =2e-3,tc2=1e-5
res. rslc2 n5 n50 = 1e3
res. rsour ce n8 n7 = 3e-3, tc1 = 1e-3,tc 2=1e- 6
res. rvthres n22 n8 = 1, tc1=-6e- 3,tc2= -1.6e-5
res.rvtemp n18 n19 = 1, tc1=-2.4e-3,tc2=1e-6
sw_v cs p.s1a n6 n12 n13 n8 = mo del =s1am od
sw_v cs p.s1b n13 n12 n1 3 n8 = m odel=s1 bmod
sw_v cs p.s2a n6 n15 n14 n13 = m odel=s2 amod
sw_v cs p.s2b n13 n15 n1 4 n13 = model= s 2bmod
v.vbat n22 n19 = dc=1
equations {
i (n51->n50) +=iscl
iscl : v (n51,n50) = ((v (n5,n51)/(1e-9+a bs(v(n5,n51)))) * ((abs(v(n5,n51)* 1e6/350))** 5))
}
}
18
22
+-
6
8
+
-
19
8
+-
17
18
6
8
++
--
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
8
14
13
MWEAK
EBREAK
DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
sw_v cs p..mo del s1amo d = (ron=1e- 5,roff =0.1,vo n=-8,vof f=-5 ) DPLCAP
ISCL
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE
EVTEMP
9
ESG
LGATE
RLGATE
20
+
-
+
-
6
10
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
SPICE Thermal Model
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
REV 23 October 2002
FDP060AN08A0T
CTHERM1 TH 6 9.6e-3
CTH ERM2 6 5 9.7e-3
CTH ERM3 5 4 9.8e-3
CTH ERM4 4 3 1e-2
CTH ERM5 3 2 3e-2
CTH ERM6 2 TL 9e-2
RTHERM1 TH 6 3.2e-3
RTH ERM2 6 5 8.1e-3
RTH ERM3 5 4 2.3e-2
RTH ERM4 4 3 1.2e-1
RTH ERM5 3 2 1.5e-1
RTH ERM6 2 TL 1.6e-1
SABER Thermal Model
SABE R t hermal m odel FDP060A N08A0T
template thermal_model th tl
the r m al_ c th , tl
{
cth er m.ctherm1 th 6 =9.6e -3
cthe rm.ctherm2 6 5 =9.7e-3
cthe rm.ctherm3 5 4 =9.8e-3
cthe rm .ctherm4 4 3 =1e -2
cthe rm .ctherm5 3 2 =3e -2
cthe rm.ctherm6 2 tl =9e-2
rtherm.rtherm1 th 6 =3.2e-3
r therm .rt herm 2 6 5 =8 . 1e-3
r therm .rt herm 3 5 4 =2 . 3e-2
r therm .rt herm 4 4 3 =1 . 2e-1
r therm .rt herm 5 3 2 =1 . 5e-1
r therm .rt he rm6 2 tl =1 . 6 e-1
}
RTHERM4
RTHERM6
RTHERM5
RTHERM3
RTHERM2
RTHERM1
CTHERM4
CTHERM6
CTHERM5
CTHERM3
CTHERM2
CTHERM1
tl
2
3
4
5
6
th JUNCTION
CASE
Mechanical Dimensions
Dimension in Millimeters
TO-220 3L
Figure 22. TO-220, Molded, 3Lead, Jedec Variation AB
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without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
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Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
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FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
11
12
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
Mechanical Dimensions
Dimension in Millimeters
TO-263 2L (D2PAK)
Figure 23. 2LD, TO263, Surface Mount
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without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-
ically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT263-002
©2003 Fairchild Semiconductor Corporation
FDP060AN08A0 / FDB060AN08A0 Rev. C4
www.fairchildsemi.com
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Rev. I66
tm
®
FDP060AN08A0 / FDB060AN08A0 — N-Channel PowerTrench® MOSFET
13
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