R09DS0039EJ0300 Rev.3.00 Page 1 of 14
Mar 12, 2013
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Data Sheet
NE5550234
Silicon Power MOS FET
FEATURES
High Output Power : Pout = 33.0 dBm TYP. (VDS = 7.5 V, IDset = 40 mA, f = 460 MHz, Pin = 15 dBm)
High power added efficiency : ηadd = 68% TYP. (VDS = 7.5 V, IDset = 40 mA, f = 460 MHz, Pin = 15 dBm)
High Linear gain : GL = 23.5 dB TYP. (VDS = 7.5 V, IDset = 40 mA, f = 460 MHz, Pin = 0 dBm)
High ESD tolerance
Suitable for VHF to UHF-BAND Class-AB power amplifier.
APPLICATIONS
150 MHz Band Radio System
460 MHz Band Radio System
900 MHz Band Radio System
ORDERING INFORMATION
Part Number Order Number Package Marking Supplying Form
NE5550234 NE5550234-AZ V5
12 mm wide embossed taping
Gate pin faces the perforation side of the tape
NE5550234-T1 NE5550234-T1-AZ
3-pin
power
minimold
(34 PKG)
(Pb-Free)
12 mm wide embossed taping
Gate pin faces the perforation side of the tape
Qty 1 kpcs/reel
Remark To order evaluation samples, please contact your nearby sales office.
Part number for sample order: NE5550234
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, unless otherwise specified)
Operation in excess of any one of these parameters may result in permanent damage.
Parameter Symbol Ratings Unit
Drain to Source Voltage VDS 30 V
Gate to Source Voltage VGS 6.0 V
Drain Current IDS 0.6 A
Drain Current
(50% Duty Pulsed)
IDS-pulse 1.2 A
Total Power Dissipation Note P
tot 12.5 W
Channel Temperature Tch 150 °C
Storage Temperature Tstg 65 to +150 °C
Note: Value at TC = 25°C
CAUTION
Observe precautions when handling because these devices are sensitive to electrostatic discharge.
R09DS0039EJ0300
Rev.3.00
Mar 12, 2013
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 2 of 14
Mar 12, 2013
RECOMMENDED OPERATING RANGE (TA = 25°C)
Parameter Symbol Test Conditions MIN. TYP. MAX. Unit
Drain to Source Voltage VDS 7.5 9.0 V
Gate to Source Voltage VGS 1.65 2.20 2.85 V
Drain Current IDS 0.38 A
Input Power Pin f = 460 MHz, VDS = 7.5 V 15 20 dBm
ELECTRICAL CHARACTERISTICS (TA = 25°C, unless otherwise specified)
Parameter Symbol Test Conditions MIN. TYP. MAX. Unit
DC Characteristics
Gate to Source Leakage Current IGSS V
GS = 6.0 V 100 nA
Drain to Source Leakage Current
(Zero Gate Voltage Drain Current)
IDSS V
DS = 25 V 10 μA
Gate Threshold Voltage Vth V
DS = 7.5 V, IDS = 1.0 mA 1.15 1.65 2.25 V
Drain to Source Breakdown Voltage BVDSS I
DS = 10
μ
A 25 38 V
Transconductance Gm V
DS = 7.5 V, IDS = 140±20 mA 0.44 S
Thermal Resistance Rth Channel to Case 10.0 °C/W
RF Characteristics
Output Power Pout f = 460 MHz, VDS = 7.5 V, 31.5 33.0 dBm
Drain Current IDS P
in = 15 dBm, 0.38 A
Power Drain Efficiency
η
d I
Dset = 40 mA (RF OFF) 70 %
Power Added Efficiency
η
add 68 %
Linear Gain GL Note 1 23.5 dB
Load VSWR Tolerance Note 2 f = 460 MHz, VDS = 9.0 V,
Pin = 15 dBm,
IDset = 40 mA (RF OFF)
Load VSWR=20:1(All Phase)
No Destroy
Output Power Pout 33.0 dBm
Drain Current IDS 0.36 A
Power Drain Efficiency
η
d 74 %
Power Added Efficiency
η
add 73 %
Linear Gain GL Note 3
f = 157 MHz, VDS = 7.5 V,
Pin = 15 dBm,
IDset = 40 mA (RF OFF)
25.8 dB
Output Power Pout 32.2 dBm
Drain Current IDS 0.35 A
Power Drain Efficiency
η
d 62 %
Power Added Efficiency
η
add 60 %
Linear Gain GL Note 4
f = 900 MHz, VDS = 7.5 V,
Pin = 17 dBm,
IDset = 40 mA (RF OFF)
18.3 dB
Notes: 1. Pin = 0 dBm
2. These characteristics values are measurement using measurement tools especially by RENESAS.
3. Pin = 5 dBm
4. Pin = 7 dBm
Remark DC performance is 100% testing. RF performance is testing several samples per wafer.
The wafer rejection criterion for standard devices is 1 reject for several samples.
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 3 of 14
Mar 12, 2013
TEST CIRCUIT SCHEMATIC FOR 460 MHz
C20
C10
IN OUT
C22
C11 C12 C21
C1
V
DS
C1 L1R1
V
GS
NE5550234
50 Ω50 Ω
L20L10 L11
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol Value Type Maker
C1 1
μ
F GRM31MR71H105KA88L Murata
C10 27 pF GRM1882C1H270JA01 Murata
C11 3.9 pF GRM1882C1H3R9CZ01 Murata
C12 18 pF GRM1882C1H180JA01 Murata
C20 12 pF GRM1882C1H120JA01 Murata
C21 1.5 pF GRM1882C1H1R5CZ01 Murata
C22 100 pF GRM2162C1H101JA01D Murata
R1 4.7 kΩ 1/10 W Chip Resistor SSM
SSM_RG1608PB472
L1 47.2 nH
φ
0.4 mm,
φ
D = 2 mm, 7 Turns Ohesangyou
L10, L11 12 nH LL1608-FS12NJ TOKO
L20 7.8 nH
φ
0.4 mm,
φ
D = 1.4 mm, 3 Turns Ohesangyou
PCB R1766, t = 0.8 mm,
ε
r = 4.8, size = 30 × 40 mm Panasonic
SMA Connecter WAKA 01K0790-20 WAKA
COMPONENT LAYOUT OF TEST CIRCUIT FOR 460 MHz
OUT
VGS VDS
C1
C1
IN
C1
C1
R1
R1 L1
L1
C10
C10
C11
C11 L10
L10
C12
C12L11
L11 L20
L20 C20
C20 C21
C21
C22
C22
<R>
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 4 of 14
Mar 12, 2013
TYPICAL CHARACTERISTICS 1 (TA = 25°C)
RF: f = 460MHz, VDS = 3.6/4.5/6/7.5/9 V, IDset = 40 mA, Pin = –15 to 20 dBm
IM: f1 = 460MHz, f2 = 461 MHz, VDS = 3.6/4.5/6/7.5/9 V, IDset = 40mA, Pout (2 tone) = 6 to 28 dBm
3rd/5th Order Intermodulation Distortion IM3/IM5 (dBc)
2 Tones Output Power Pout (2 tone) (dBm)
IM
3
/IM
5
vs. 2 TONES OUTPUT POWER
2nd Harmonics 2f0 (dBc)
3rd Harmonics 3f0 (dBc)
Output Power Pout (dBm)
2f
0
, 3f
0
vs. OUTPUT POWER
Power Gain GP (dB)
Power Added Efficiency add (%)
η
Input Power Pin (dBm)
POWER GAIN, POWER ADDED
EFFICIENCY vs. INPUT POWER
2f0 - 3.6 V
2f0 - 4.5 V
2f0 - 7.5 V
2f0 - 9 V
3f0 - 3.6 V
3f0 - 4.5 V
3f0 - 9 V
3f0 - 7.5V
3f0 - 6 V
2f0 - 6 V
70
0
10
20
30
40
50
60
402520150510 30
IM3 - 3.6 V
IM3 - 4.5 V
IM3 - 7.5 V
IM3 - 9 V
IM5 - 3.6 V
IM5 - 4.5 V
IM5 - 9 V
IM5 - 7.5 V
IM5 - 6 V
IM3 - 6 V
70
0
10
20
30
40
50
60
302520150510
Output Power Pout (dBm)
Drain Current IDS (A)
Input Power Pin (dBm)
OUTPUT POWER, DRAIN CURRENT
vs. INPUT POWER
Pout - 3.6 V
Pout - 4.5 V
Pout - 7.5 V
Pout - 9 V
Pout - 6 V
IDS - 7.5 V
IDS - 4.5 V
IDS - 6 V
IDS - 9 V
0
40
35
30
25
20
15
10
5
25201050–20 –10 –5 15 0.0
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
–15
add - 3.6 V
add - 7.5 V
add - 4.5 V
add - 6 V
add - 9 V
Gp - 3.6 V
Gp - 4.5 V
Gp - 7.5 V
Gp - 9 V
Gp - 6 V
00
40 80
35 70
30 60
25 50
20 40
15 30
10 20
510
25201050–20 –10 –5 15
–15
35
IDS - 3.6 V
η
η
η
η
η
Remark The graphs indicate nominal characteristics.
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 5 of 14
Mar 12, 2013
TEST CIRCUIT SCHEMATIC FOR 157 MHz
C20
C10
IN OUT
C22
C11 C21
C2
VDS
C1 L1R1
VGS
NE5550234
50 Ω50 Ω
L11
L10 R10
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol Value Type Maker
C10 27 pF GQM1882C1H270JB01 Murata
C11 6.8 pF GQM1882C1H6R8DB01 Murata
C20 8.2 pF GQM1882C1H8R2DB01 Murata
C21 27 pF GQM1882C1H270JB01 Murata
C22 100 pF GQM1882C1H101JB01 Murata
C1 1
μ
F GRM21BB31H105KA2L Murata
C2 1
μ
F GRM21BB31H105KA2L Murata
L10 100 nH LL1608-FSLR10J Toko
L11 47 nH D20-47N2 Ohesangyou
L1 74 nH D20-74N7 Ohesangyou
R10 5.6 Ω MCR03J5R6 Rohm
R1 4.7 kΩ MCR03J472 Rohm
PCB R1766, t = 0.8 mm,
ε
r = 4.8, size = 30 × 40 mm Panasonic
SMA Connecter WAKA 01K0790-20 WAKA
<R>
<R>
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 6 of 14
Mar 12, 2013
COMPONENT LAYOUT OF TEST CIRCUIT FOR 157 MHz
C10
C11 C20 C21
C22
C1
R10
L1
C2
L10
RF IN RF OUT
VGS VDS
L11
R1
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 7 of 14
Mar 12, 2013
TYPICAL CHARACTERISTICS 2 (TA = 25°C)
RF: f = 157 MHz, VDS = 3.6/4.5/6/7.5/9 V, IDset = 40 mA, Pin = –10 to 20 dBm
add - 3.6 V
add - 6 V
add - 4.5 V
add - 9 V
add - 7.5 V
Pout - 3.6 V
Pout - 4.5 V
Pout - 6.0 V
Pout - 7.5 V
Pout - 9 V
Output Power Pout (dBm)
Drain Current IDS (A)
Input Power Pin (dBm)
OUTPUT POWER, DRAIN CURRENT
vs. INPUT POWER
0 0.0
40 0.8
35 0.7
30 0.6
25 0.5
20 0.4
15 0.3
10 0.2
5 0.1
251050–15–10 –5 15
Power Gain GP (dB)
Power Added Efficiency add (%)
η
Input Power Pin (dBm)
POWER GAIN, POWER ADDED
EFFICIENCY vs. INPUT POWER
Gp - 3.6 V
Gp - 4.5 V
Gp - 6 V
Gp - 7.5 V
Gp - 9 V
00
40 80
35 70
30 60
25 50
20 40
15 30
10 20
510
IDS - 3.6 V
IDS - 6 V
IDS - 4.5 V
IDS - 9 V
IDS - 7.5 V
η
η
η
η
η
20 251050–15–10 –5 15 20
Remark The graphs indicate nominal characteristics.
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 8 of 14
Mar 12, 2013
TEST CIRCUIT SCHEMATIC FOR 900 MHz
C10
IN OUT
C22
C21
C20
C2
V
DS
C1 L1R1
V
GS
NE5550234
50 Ω50 Ω
L11
L10
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol Value Type Maker
C10 10 pF GQM1882C1H100JB01 Murata
C20 6.8 pF GQM1882C1H6R8DB01 Murata
C21 1 pF GQM1884C2A1R0CB01 Murata
C22 100 pF GQM1882C1H101JB01 Murata
C1 1
μ
F GRM21BB31H105KA2L Murata
C2 1
μ
F GRM21BB31H105KA2L Murata
L10 2.7 nH LL1608-FSL2N7S Toko
L1 74 nH D20-74N7 Ohesangyou
R1 4.7 kΩ MCR03J472 Rohm
PCB R1766, t = 0.8 mm, εr = 4.8, size = 30 × 40 mm Panasonic
SMA Connecter WAKA 01K0790-20 WAKA
<R>
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 9 of 14
Mar 12, 2013
COMPONENT LAYOUT OF TEST CIRCUIT FOR 900 MHz
C10
C20 C21
C22
C1
R1 L1
C2
L10
RF IN RF OUT
VGS VDS
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 10 of 14
Mar 12, 2013
TYPICAL CHARACTERISTICS 3 (TA = 25°C)
RF: f = 900 MHz, VDS = 3.6/4.5/6/7.5/9 V, IDset = 40 mA, Pin = –10 to 20 dBm
Input Power P
in
(dBm)
POWER GAIN, DRAIN CURRENT
vs. INPUT POWER
0
35
30
25
20
15
10
5
0
35
30
25
20
15
10
5
0
100
80
60
40
20
25201050–15–10 –5 15 25201050–15–10 –5 15
Power Gain G
P
(dB)
Power Added Efficiency
add
(%)
η
Input Power P
in
(dBm)
OUTPUT POWER, POWER ADDED
EFFICIENCY vs. INPUT POWER
Output Power P
out
(dBm)
Drain Current I
DS
(A)
140
120
0
0.5
0.4
0.3
0.2
0.1
0
100
80
60
40
20
0
100
80
60
40
20
0.7
0.6
add
- 6.0 V
add
- 4.5 V
add
- 7.5 V
add
- 9 V
add
- 3.6 V
G
P
- 3.6 V
G
P
- 4.5 V
G
P
- 6 V
G
P
- 7.5 V
G
P
- 9 V
η
η
η
η
η
I
DS
- 3.6 V
I
DS
- 6.0 V
I
DS
- 4.5 V
I
DS
- 9 V
I
DS
- 7.5 V
P
out
- 3.6 V
P
out
- 4.5 V
P
out
- 6.0 V
P
out
- 7.5 V
P
out
- 9 V
Remark The graphs indicate nominal characteristics.
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 11 of 14
Mar 12, 2013
S-PARAMETERS
S-parameters and noise parameters are provided on our web site in a form (S2P) that enables direct import of the
parameters to microwave circuit simulators without the need for keyboard inputs.
Click here to download S-parameters.
[Products] [RF Devices] [Device Parameters]
URL http://www.renesas.com/products/microwave/
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 12 of 14
Mar 12, 2013
MOUNTING PAD LAYOUT DIMENSIONS
3-PIN POWER MINIMOLD (34 PKG) (UNIT: mm)
2.2
1.0
2.0 2.0
1.0 1.0
1.4
0.4 0.92.8
45°45°
Remark The mounting pad layout in this document is for reference only.
When designing PCB, please consider workability of mounting, solder joint reliability, prevention of solder
bridge and so on, in order to optimize the design.
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 13 of 14
Mar 12, 2013
PACKAGE DIMENSIONS
3-PIN POWER MINIMOLD (34 PKG) (UNIT: mm)
(Bottom View) (Side View)
PIN CONNECTIONS
1. Drain
2. Source
3. Gate
1.5±0.1
0.41
+0.03
–0.06
4.5±0.1
0.42±0.060.42±0.06
1.6±0.2
3.0
1.5
2
13
2.5±0.1
4.0±0.25
0.8 MIN.
0.47±0.06
NE5550234
R09DS0039EJ0300 Rev.3.00 Page 14 of 14
Mar 12, 2013
RECOMMENDED SOLDERING CONDITIONS
This product should be soldered and mounted under the following recommended conditions. For soldering methods and
conditions other than those recommended below, contact your nearby sales office.
Soldering Method Soldering Conditions Condition Symbol
Infrared Reflow Peak temperature (package surface temperature) : 260°C or below
Time at peak temperature : 10 seconds or less
Time at temperature of 220°C or higher : 60 seconds or less
Preheating time at 120 to 180°C : 120±30 seconds
Maximum number of reflow processes : 3 times
Maximum chlorine content of rosin flux (% mass) : 0.2% (Wt.) or below
IR260
Wave Soldering Peak temperature (molten solder temperature) : 260°C or below
Time at peak temperature : 10 seconds or less
Preheating temperature (package surface temperature)
: 120°C or below
Maximum number of flow processes : 1 time
Maximum chlorine content of rosin flux (% mass) : 0.2% (Wt.) or below
WS260
Partial Heating Peak temperature (terminal temperature) : 350°C or below
Soldering time (per side of device) : 3 seconds or less
Maximum chlorine content of rosin flux (% mass) : 0.2% (Wt.) or below
HS350
CAUTION
Do not use different soldering methods together (except for partial heating).
All trademarks and registered trademarks are the property of their respective owners.
C - 1
Revision History NE5550234 Data Sheet
Description
Rev. Date
Page Summary
1.00 Apr 25, 2012 First edition issued
2.00 Jul 04, 2012 p.2 Modification of ELECTRICAL CHARACTERISTICS
3.00 Mar 12, 2013 P3
Modification of COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
P5 Modification of TEST CIRCUIT SCHEMATIC FOR 157 MHz
P8
Modification of COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
Notice
1. Descriptions of circuits, software and other related information in this document are provided only to illustrate the operation of semiconductor products and application examples. You are fully responsible for
the incorporation of these circuits, software, and information in the design of your equipment. Renesas Electronics assumes no responsibility for any losses incurred by you or third parties arising from the
use of these circuits, software, or information.
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assumes no liability whatsoever for any damages incurred by you resulting from errors in or omissions from the information included herein.
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technical information described in this document. No license, express, implied or otherwise, is granted hereby under any patents, copyrights or other intellectual property rights of Renesas Electronics or
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range, movement power voltage range, heat radiation characteristics, installation and other product characteristics. Renesas Electronics shall have no liability for malfunctions or damages arising out of the
use of Renesas Electronics products beyond such specified ranges.
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(Note 1) "Renesas Electronics" as used in this document means Renesas Electronics Corporation and also includes its majority-owned subsidiaries.
(Note 2) "Renesas Electronics product(s)" means any product developed or manufactured by or for Renesas Electronics.
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